System and method for monitoring optimal dental implants coupleable with an optimized impant site

ABSTRACT

Computer-implemented method and system for monitoring dental implant comprising the steps of graphically simulating an anatomy of a provided dental prosthesis coupleable to a dental implant; simulating an optimized implant site for the dental implant as a function of implant parameters of the dental implant and first parameters of the optimized implant site; calculating a plurality of optimal dental implants; selecting a usable implant from the plurality of optimal dental implants; calculating first deviations between first parameters of the optimized implant site and first parameters of the usable implant; calculating second deviations between second parameters of the optimal dental implants not selected as usable implants and first parameters of the optimized implant site; calculating real optimized parameters of the optimized implant site as a combined function of first deviations and second deviations.

TECHNICAL FIELD

The present invention relates to a computer-implemented method for monitoring dental implants.

The present invention further relates to a system for monitoring dental implants.

In particular, the present invention relates to a method/system for monitoring dental implants coupleable to an optimized implant site.

BACKGROUND OF THE INVENTION

At present, dental implants are designed and prepared according to the dentist's directions mainly on the basis of the experience gained.

Some guidelines suggest fairly coarse criteria to define the characteristic parameters of dental implants to be applied to patients.

It is an object of the present invention to provide a method/system for monitoring dental implants capable of defining plant parameters that guarantee stability and efficiency.

Another object of the present invention is to provide an easy-to-use monitoring method/system for dental implants.

A further object of the present invention is to provide a stable and efficient dental implant.

SUMMARY OF THE INVENTION

In a first aspect, the present invention describes a computer-implemented method for monitoring dental implants according to what is described in claim 1.

Further advantageous aspects of the method are described in the dependent claims 2 to 14.

In a second aspect, the present invention describes a computer program configured to implement the method of the first aspect, according to what is described in claim 15.

In a third aspect, the present invention describes a system for monitoring dental implants according to claim 16.

Further advantageous aspects of the method are described in the dependent claim 18.

In a fourth aspect, the present invention describes a dental implant, obtained by one of the preceding aspects of the invention, according to claim 19.

The invention confers the main technical effect of identifying a real optimal dental implant in terms of structure, for example tooth identification code, sizing, for example diameter and length, and position, e.g. angle.

In particular, the invention, as described, achieves the following technical effects:

-   -   objective identification of a real optimal dental implant.     -   easy identification of a real optimal dental implant.     -   compliance of dental implant guidelines with optimal real         values.     -   ability to couple 3D simulations obtained at different times,         for example at the time of the first simulation and at the time         of calculating real calculated parameters, by overlapping them         for the purpose of evaluating parameters variation over time.

The mentioned technical effects/advantages and further technical/advantageous effects of the invention will be more clearly described in the following description of an embodiment provided by way of non-limiting example with reference to the attached drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram of the system/method according to the present invention.

The unit of FIGS. 2 (2 a, 2 b, 2 c) is a detail of a portion of the block diagram of FIG. 1.

FIG. 3A is a schematic view of a dental implant, according to the present invention.

FIG. 3B shows a reference system used in FIG. 3A.

FIG. 3C schematically shows a dental implant in a maxillary arch according to the present invention.

FIGS. 4-6 show functions of the system/method, according to the present invention.

FIG. 7 shows a schematic view of a mandibular bone and of a simulated dental prosthesis.

FIG. 8 is a schematic view of greater detail of FIG. 7.

FIG. 9 is a schematic view of representative measurements of the mandibular bone with respect to an ideal surgical axis.

FIG. 9A shows a reference system for the measurements of FIG. 9.

FIG. 10 is a schematic representation of reciprocal positions of ideal surgical axes and a prosthetic axis.

DETAILED DESCRIPTION

In the present description the following terminology will be used several times and kept as a reference also in the attached claims:

dental implant=screw entering the mandibular/maxillary bone;

implant site=cavity in the mandible/maxilla which receives the dental implant;

stump=pin that mates with the free end of the dental implant;

crown=tooth-shaped cover that mates with the free end of the stump;

dental prosthesis=set of stump and crown;

edentulous site=volumetric space intended to receive the dental prosthesis, in particular the space between two existing teeth;

vestibule=space between the cheeks and the gums;

mandible=bone that forms the lower scaffolding of the mouth; it houses the lower teeth in the maxillary arch and is the only moving part of the face.

jaw=bone that forms the upper scaffolding of the mouth and houses the upper dental arch.

Unlike the mandible, the jaw is a fixed bone, such that it doesn't move with the opening and closing of the mouth.

Overall, the two bones are also referred to as maxillary bones and in the present description, the term maxillary bone OM will be used in this sense, i.e. without excluding that the example referred to a dental prosthesis applied to the inferior arch, excludes application to the upper arch.

The invention describes a method of monitoring dental implants and a corresponding system of monitoring dental implants.

With particular reference to FIGS. 1, 3A and 3C, the method comprises a step f1 of graphically simulating an anatomy of an envisaged dental prosthesis PD coupleable to a dental implant ID which can be inserted into a maxillary bone OM.

In particular, the simulation also shows an edentulous site LR (FIG. 3C) wherein the dental prosthesis PD corresponding to an identified tooth Tn is provided.

The invention applies both in case the tooth Tn is missing in the edentulous site, as well as if the tooth Tn is present in the edentulous site and must be rehabilitated.

As shown in FIG. 3A, the dental implant ID is installed in a maxillary bone OM at the base of the edentulous site LR (FIG. 3C), in a position occupied by the identified tooth Tn, in which Tn is the tooth identified in integrity conditions of the patient's mouth.

Preferably, the graphical simulation step f1 is performed by means of a CT scan of the oral cavity which provides data to perform a 3D reconstruction of the maxillary bones.

Alternatively or in addition, the graphic simulation is performed by means of a traditional dental prosthesis model or which may also be obtained by intra or extra-oral scanning or be virtually modeled.

An integrated graphic simulation is obtained by combining the intra or extra-oral or virtually-derived scanning with the 3D reconstruction obtained via CT scans.

Worded differently, and in sum, the graphic simulation step f1 is performed via computer-implemented graphic simulation means, particularly by way of a computer-implemented graphic simulation apparatus.

All the processing carried out are feasible starting from the first simulation step f1, without which it would not be possible any precise detection of the state of the oral cavity; non-automated detections, based essentially on the clinician's clinical expertise, are fully unappropriate for the subsequent steps of the simulation and can in no way lead to obtaining an optimized implant site.

In other words, the first simulation step f1 defines a computer-implemented mathematical graphic model wherefrom it is possible to perform innovative elaborations of the invention in order to obtain a precise and optimized simulation in terms of implementation of an implant site; the implant site thus obtained will be configured for being coupled with a corresponding dental implant.

To perform the simulation, the system of the invention comprises a first simulation station 1 designed to graphically simulate an anatomy of an envisaged dental prosthesis PD and a respective edentulous site LR corresponding to an identified tooth Tn, wherein the intended dental prosthesis PD is coupleable to a dental implant ID inseartable into the maxillary bone OM.

With reference to FIG. 1, the invention further provides a step f2 of simulating an optimized implant site SI for the dental implant ID as a function of implant parameters PIMP of the dental implant ID and of first representative parameters PSI of the optimized implant site.

The simulation performed by the invention achieves technical functions typical of modern engineering work. It provides for realistic prediction of the performance of a dental implant in respect to the designed implant site which shall accommodate the former, and thereby ideally allows the dental implant to be developed so accurately such that a prototype's chances of success can be assessed before it is built.

The technical result increases with the speed of the simulation method, as this enables a wide range of designs to be virtually tested and examined for suitability before the expensive implant fabrication process starts.

The technical result increases with the speed of the simulation method, as this enables a wide range of designs to be virtually tested and examined for suitability before the expensive implant fabrication process starts.

Without a suitable technical support, an advanced test on a complex dental implant and/or a careful selection among many different designs would not be possible, or at least not feasible within a reasonable time.

It follows that computer-implemented simulation methods for virtual testing represent a practical and practice-oriented part of the dentist's or healthcare professional's or treatment provider's toolkit. What makes them so important is the fact that there isn't a purely mathematical, theoretical or mental method which is capable of providing a complete and/or fast prediction of a dental implant performance according to the parameters of the invention, that is different or diversifiable for each single patient.

In particular, the invention provides a simulation of an optimized implant site SI performing a simulation of a patient's damaged oral cavity and defines an implant site suitable for receiving a dental implant necessary to repair the highlighted damage.

In order to perform the simulation, the system of the invention comprises a second simulation station 10 designed to simulate, according to a computer-implemented graphic mode, the optimized implant site SI for the dental implant ID as a function of implant parameters PIMP of the dental implant ID and of the first parameters PSI of the optimized implant site.

In FIG. 4A some simulated parameters of the optimized implant site are shown in tabular form.

With reference to FIG. 3C, the optimized implant site SI has an at least partially cylindrical volumetric shape VSI inscribed within an envisaged circumscribing volume V.

In more detail, for the purpose of simulating the implant site SI, with reference to FIGS. 7 to 10, the method of the invention provides for calculating an ideal prosthetic axis PI for the envisaged dental prosthesis PD as a function of the graphic simulation performed by the first simulation station 1.

As described in the Italian priority applications in the name of the same Applicant, by ideal prosthetic axis it is meant an axis crossing an ideal point of the envisaged dental prosthesis PD as a function of the type of tooth considered.

In particular, in a first case of molar and premolar teeth (FIG. 5), the ideal prosthetic axis PI for the envisaged dental prosthesis PD is obtained as the axis passing through the center pt1 of the envisaged dental prosthesis PD.

In particular, in a second case of incisor, lateral and canines teeth (FIG. 12), the ideal prosthetic axis PI for the envisaged dental prosthesis PD is obtained as the axis passing through the palatal vertex pt2 of a triangle that schematizes the occlusal surface of the envisaged dental prosthesis PD.

In other words, in a first case of molar and premolar teeth, the ideal point pt1 will be at the center of the dental prosthesis PD and the crown CO, whereas, in a second case of anterior (incisor, lateral and canine) teeth, the ideal point pt2 will be at the apex of the palatal angle.

In both cases, for the calculation of this axis, the method involves obtaining two pairs of measurements of the simulated dental prosthesis PD, in particular a first pair of cervical measures and a second pair of apical measurements that are defined in terms of statistical data dependent on the position of the tooth and the anatomy of the arch opposed to that in which the dental prosthesis PD is being inserted.

The pair of measurements is calculated in the vestibulo-language and antero-posterior direction.

More in detail, the first pair of measurements is performed at the crown of the dental prosthesis PD and in the vestibular-tongue and anterior-posterior direction.

The second pair of measurements is performed at the collar of the dental prosthesis PD and in the vestibular-tongue and anterior-posterior direction. Alternatively or additionally, the pair of measurements is calculated in a mesiodistal direction.

In more detail, the first pair of measurements is performed at the crown of the dental prosthesis PD, whereas the second pair of measurements is performed at the collar of the dental prosthesis PD.

The method involves calculating the prosthetic axis PI as a straight line passing through the intersection points of the segments of each pair of measurements.

Preferably, the ideal prosthetic axis also passes through a second point at the cervical level that corresponds to the center of the tooth for premolars and molars and at the apex of the triangle for the anterior teeth.

Based on same priority applications, by ideal axis it is meant an axis configured to perform an ideal halving of the bone quantity of the maxillary bone OM at an edentulous site LR.

With particular reference to FIG. 8, the method further provides for calculating a first cervical distance CT and a first apical distance ET of the maxillary bone OM at the edentulous site LR as a function of the graphic simulation in which the distances are calculated in a first direction relative to the maxillary bone OM;

With particular reference to FIG. 9, the method further provides for calculating a second cervical distance CW and a second apical distance EW of the maxillary bone OM at the edentulous site LR as a function of the graphical simulation, in which the distances are calculated in a second direction to the maxillary bone OM.

Preferably, the first cervical distance CT is detected at a first cervical height q1 with respect to a reference height, e.g. relative to the upper bone margin, visible in FIG. 6.

Preferably, the first apical distance ET is detected at a first apical height q2 with respect to a reference height, in particular with respect to the inferior maxillary nerve NAI in the posterior mandible, or to another anatomic structure to be taken into account.

The method further provides to calculate an ideal surgical axis CI (FIG. 8) on the maxillary bone OM as a function of the cervical distances CT, CW and the apical distances CW, EW.

The steps described so far for the simulation of the implant site SI are performed taking into account that the ideal prosthetic axis PI and the ideal surgical axis CI determine a reference system REF_ID (FIG. 10) for the dental implant ID and that the ideal axis prosthetic PI and the ideal surgical axis CI are offset by an offset angle α.

The method further provides for calculating a bone height HR of the maxillary bone OM as a function of the calculated first cervical distance CT and first apical distance ET, wherein the bone height HR is representative of a bone availability of the maxillary bone OM at the edentulous site LR.

The method further provides to move the ideal surgical axis CI by determining a compromise surgical axis CI_i (i=1 . . . n) (FIG. 10) corresponding to a variable deviation angle αi (i=1 . . . n) relative to the ideal prosthetic axis PI.

According to the invention, the simulation is performed at least according to the implant parameters PIMP.

The implant parameters PIMP comprise at least:

-   -   the identified tooth Tn;     -   the first cervical distance CTi and the first apical distance         ETi;     -   the second cervical distance CWi and the second apical distance         EWi;     -   the first bone height HRi;     -   the variable deviation angle αi.

In particular, the first cervical distance CTi and the first apical distance ETi of the maxillary bone OM are simulated at the edentulous site LR, corresponding to the envisaged dental prosthesis PD, in a first direction with respect to the maxillary bone OM.

In particular, the second cervical distance CW and the second apical distance EW of the maxillary bone OM are simulated at the edentulous site LR, corresponding to the envisaged dental prosthesis PD, in a second direction with respect to the maxillary bone OM.

In particular, the first bone height HRi is representative of a bone availability of the maxillary bone OM at the edentulous site LR.

In particular, the variable deviation angle αi is included between the ideal surgical axis CI of the maxillary bone OM and the ideal prosthetic axis PI passing through the dental prosthesis PD.

According to the invention, the simulation is also carried out as a function of the first representative parameters PSI of the optimized implant site SI. The first representative parameters PSI of the optimized implant site SI include at least:

-   -   a diameter DTi of the at least partially cylindrical volumetric         shape VSI;     -   a height LIi of the at least partially cylindrical volumetric         shape VSI;

According to the invention, the first representative parameters PSI exhibits variable values as a function of the variable deviation angle αi and of a global rating R.

The first representative parameters PSI include one or more rating values (Rαi, RDT, RLI, RRLRC, RPO, RDO) of the optimized implant site SI defined as a function of a comparison between the first representative parameters PSI and reference threshold values.

The optimized implant site SI is identified with a global rating R defined as a combined function of one or more of the rating values (Rαi, RDT, RLI, RRLRC, RPO, RDO).

In particular, the simulation of the optimized implant site SI is implemented according to the global rating R of the optimized implant site SI defined as a function of one or more of:

-   -   a deviation angle rating R_αi of said deviation angle αi;     -   a rating of diameter R_DT of the diameter DT;     -   a length rating R_LI of the length measurement LI of the         optimized implant site SI;     -   a crown/root ratio rating R_RL_RC;     -   a rating of implant percentage in the bone R_PO;     -   a bone density rating R_DO.         where the rating values Rαi, RDT, RLI, RRLRC, RPO, RDO of the         optimized implant site SI are defined based on a comparison         between the current values αi, DT, LI, RLRC, PO, DO and         respective reference thresholds.

Worded differently, the global rating R of the optimized implant site SI is indicative of the compliance of the optimized implant site SI with predefined reference thresholds of the first representative parameters PSI.

The invention provides a step f3 of calculating a plurality of dental implants MIi as a function of comparing at least the first parameters PSI of the optimized implant site SI and representative parameters PIE of existing dental implants.

Preferably, as shown in FIG. 1, the parameters PIE are stored in a database IE.

In particular, with reference to FIG. 1, to calculate the plurality of dental implants MIi, the calculation is performed by a first processing station 40 configured to calculate a plurality of dental implants MIi as a function of comparing at least the first parameters PSI of the optimized implant site SI with representative parameters PIE of existing dental implants.

The invention provides a subsequent step f4 of calculating a plurality of optimal dental implants BMIii as a function of comparing between the first representative parameters PSI and the second representative parameters PIE when the global rating R of the optimized implant site SI is minimized.

In other words, the invention provides identifying a dental implant ID for the optimized implant site SI which performs a simulation of a patient's damaged oral cavity, and defining a plurality of optimal dental implants BMIi applicable to such optimized implant site SI.

In particular, with reference to FIG. 1, the system of the invention comprises a first processing station (40) capable of calculating parameters of a plurality of optimal dental implants BMIi as a function of comparing between at least the parameters of the optimized implant site PSI and the representative parameters PIE of existing dental implants based on a minimized rating R of the optimized implant site PSI, wherein the rating R is indicative of the optimized implant site PSI being in compliance with predefined reference thresholds of the representative parameters PSI.

FIG. 4B shows some calculated optimal dental implants BMIi in table form, in particular a first optimal implant BMI0, a second optimal implant BMI1 and a third optimal implant BMI2, based on respective calculated parameters.

The optimal dental implants BMIi are characterized by PBMI parameters.

Preferably, with reference to FIG. 5, the parameters PBMI comprise:

-   -   an identified tooth Tn;     -   a diameter DTi of the at least partially cylindrical volumetric         shape VSI;     -   a height L1 of the at least partially cylindrical volumetric         shape VSI;     -   a deviation angle α;     -   an overall rating R.

Preferably,

-   -   an Ub identifier of the system manufacturer (brend)     -   an Um identifier of the implant model.

With particular reference to FIG. 1, after having identified the optimal usable implants, the invention advantageously provides a step f5 of selecting a usable implant UI from the plurality of optimal dental implants BMIi.

In other words, the usable implant UI is defined as a function of the optimal dental implants BMIi, i.e. UI=f (BMij).

In order to obtain the selection, with reference to FIG. 1, the system of the invention comprises a second processing station 30 comprising in turn a first calculation unit 301 adapted to select the usable implant UI from the plurality of optimal dental implants BMIi.

Preferably, selection is made based on a clinician's clinic expertise.

The usable implant UI will be characterized by first parameters PUI.

Preferably, with reference to FIG. 5, the first parameters PUI comprise:

-   -   an identified tooth UTn;     -   a diameter UDTi of the at least partially cylindrical volumetric         shape VSI;     -   a height ULIi of the at least partially cylindrical volumetric         shape VSI;     -   a deviation angle Uα;     -   a global rating value UR.

Preferably, the first parameters PUI further comprise

-   -   an Ub identifier of the implant manufacturer (brend)     -   an Um identifier of the implant model.

FIG. 5 depicts the first parameters PUI in tabular form as well as the simulated parameters of the optimized implant site.

The invention further provides a step f6 of calculating first deviations ΔUIi between the parameters of the optimized implant site PSI and the first parameters PUI of the usable implant UI.

The technical effect achieved is an estimate of the conformity between the parameters automatically calculated for the optimized implant site SI and the parameters of the usable implant obtained also as a function of the clinician's clinic expertise; this allows having a first matching between the simulated implant and the implant actually used.

To perform the calculation, the second processing station 30 comprises a second calculation unit 302 (FIG. 1) caplable of calculating first deviations ΔUI between the parameters of the optimized implant site PSI and the first parameters PUI of the usable implant UI.

FIG. 6 shows an example of first deviations ΔUI in table form between the parameters of the usable implant UI and the simulated parameters of the optimized implant site SI.

The invention provides a further step f7 of calculating second deviations ΔBMij between

-   -   second parameters PBMij of the plurality of optimal dental         implants BMIi not selected as usable implants UI, and     -   the parameters of the optimized implant site PSI.

In particular, the calculation of the second parameters is performed on at least one first plurality P1 of optimal dental implants BMij.

According to the invention, the first plurality P1 of optimal dental implants BMij comprises a first plurality n of implants with rating RBMij next to the rating RPSI of the optimized implant site PSI.

This solution is provided in the case of a reduced number of optimal dental implants BMi, preferably with n being such that 3<n<5.

In other words, the implants with the best rating are the ones taken into account, i.e. the ones being most proximate to the ideal case of the optimized implant site, regardless of respective rating values.

This solution may be defined as a proximity solution.

Alternatively, or in addition, the calculation of the second parameters is performed on at least one second plurality P2 of optimal dental implants BMij.

According to the invention, the second plurality P2 of optimal dental implants BMij comprises a second plurality m of optimal dental implants with rating RBMij being lower than a predefined R_pred rating value.

In other words, in the case of a high number of optimal dental implants BMi (e.g. 20) and with several optimal dental implants being proximate to the ideal case, the implants being most proximate to the ideal case are the ones selected according to a predefined rating value, for example R_pred<=1.5)).

In this case, there exists a number of BMI with almost coincident values.

This solution can be defined as a statistical solution.

The calculation of the second parameters is performed by the second processing station 30, in particular by a third processing unit 303 suitable for calculating second deviations ΔBMij between:

-   -   the second parameters PBMij of at least one plurality P1, P2 of         optimal dental implants BMij of the plurality of optimal dental         implants BMIi not selected as usable UI implants and     -   the parameters PSI of the optimized implant site SI.

FIG. 6 shows examples of second deviations ΔBMij in table form between the parameters of optimal dental implants BMI and the simulated parameters of the optimized implant site SI.

The invention provides, at this point, a step f8 of calculating optimized real parameters PSIR of the optimized implant site SI in a combined function of the first deviations ΔUI and second deviations ΔBMij.

With reference to FIG. 1, a processing unit 304 is adapted to calculate the optimized real parameters PSIR of the optimized implant site SI.

The technical effect achieved is concerned with the determination of real and consolidated values based on which the sector guidelines are to be adapted.

Preferably, the method comprises a further step f9 of overlapping the optimized implant site SI, defined in step f8 as a function of the calculated real optimized parameters PSIR, on the optimized implant site SI simulated in step f2 as a function of the implant parameters PIMP and the first parameters PSI of the optimized implant site SI.

The technical effect achieved is a verification of the stability of the biological result obtained (bone volumes) in the application of the method/monitoring system of the invention.

This makes it possible to overlap a real post-production reconstruction of the dental implant to the original simulation.

The second processing station 30 comprises, for this purpose, an overlapping module 305 (FIG. 1) configured to overlap the optimized implant site SI, defined in step f8, on the optimized implant site SI simulated in step f2, in order to obtain the effects described herein.

In particular, the overlapping module 305 is configured to execute step f9 of overlapping:

-   -   said optimized real parameters PSIR of the optimized implant         site SI calculated from said fourth calculation unit 304 as a         combined function of said first deviations ΔUI and said second         deviations ΔBMij, with     -   said optimized implant site SI, simulated according to a         computer-implemented graphic mode, for said dental implant ID as         a function of said implant parameters PIMP of said dental         implant ID and of first parameters PSI of said optimized implant         site SI, thus causing an overlapping between original simulation         and actual post-production reconstruction of the dental implant.

According to the invention, the step of calculating the optimized real parameters PSIR of the optimized implant site SI provides various implementation solutions.

In a first solution, calculating actual optimized parameters PSIR comprises a step f71 of comparing the first deviations ΔUI and the average M of the second deviations ΔBMij.

As shown in FIG. 2, a first calculation module 304A in the processing unit 304 is configured to perform the step f71.

Preferably, the step f71 of comparing the first deviations ΔUI and the average M of the second deviations ΔBMij, includes the sub-steps of:

-   -   calculating the average M of the second deviations ΔBMij     -   comparing the value of the average M calculated together with         the values of the first deviations ΔUI;     -   calculating the optimized real parameters PSIR as a function of         the comparison.

In more detail, in the comparison step f71, if the value of the calculated average M is lower than the first deviations ΔUI, i.e. if the module of the average M is smaller than the first deviations ΔUI, the step f71 provides a further sub-step of calculating the optimized real parameters PSIR by modifying the parameters of the optimized implant site PSI with the value of the average M of the second deviations ΔBMij being summed or substracted.

In other words, PSIR=PSI+|M|.

In this calculation of the optimized real parameters PSIR, all values of the second deviations ΔBMij are taken into account when calculating the average M with the respective marks, i.e. the values of the second deviations taken into account can be positive or negative relative to the parameters of the optimized implant site.

According to variants of the first solution, the step f7 of calculating second deviations ΔBMij comprises:

-   -   calculating second positive deviations ΔBMij+ and/or second         negative deviations ΔBMij− defined respectively as a function of         a diameter value of the optimal implant BMIi being greater or         smaller than the value of the diameter of the optimized implant         site PSI;     -   calculating optimized real oversized parameters PSIR+ and/or         optimized real undersized parameters PSIR− of the optimized         implant site SI as a combined function of the first deviations         ΔUI and second positive ΔBMij+ or negative ΔBMij− deviations         respectively.

In particular, in a first variant of the first solution, the third processing unit 303 is able to calculate second positive deviations ΔBMij+ between:

-   -   the second parameters PBMij of at least one plurality P1, P2 of         optimal dental implants BMij of the plurality of optimal dental         implants BMIi not selected as usable implants UI     -   the parameters PSI of the optimized implant site PSI.

The calculation is made when the diameter value of the optimal implant is greater than the value of the diameter of the optimized implant site PSI.

At this stage, the invention provides, based on aforementioned step f8, calculating optimized real oversized parameters PSIR+ of the optimized implant site SI as a combined function of the first deviations ΔUI and second positive deviations ΔBMij+.

With reference to FIG. 1, the processing unit 304 is able to calculate the optimized real oversized parameters PSIR+ of the optimized implant site SI.

In this variant the calculation of optimized real oversized parameters PSIR+ takes into account only the positive values of the second ΔBMij deviations for calculating the average M with respect to the parameters values of the optimized implant site.

In particular, in a second variant of the first solution, the third processing unit 303 is suitable for calculating second negative deviations ΔBMij− between:

-   -   the second PBMij parameters of at least one plurality P1, P2 of         optimal dental implants BMij of the plurality of optimal dental         implants BMIi not selected as usable implants UI     -   the parameters PSI of the optimized implant site PSI.

The calculation is made when the value of the optimal implant diameter is less than the value of the optimized implant site diameter PSI.

At this stage, the invention provides, based on aforementioned step f8, calculating optimized real oversized parameters PSIR− of the optimized implant site SI as a combined function of the first deviations ΔUI and second negative deviations ΔBMij−.

With reference to FIG. 1, the processing unit 304 is adapted to calculate the optimized real oversized parameters PSIR− of the optimized implant site SI.

In this variant the calculation of the optimized real undersized parameters PSIR− takes into account only the negative values of the second deviations ΔBMij for calculating the average M with respect to the parameters value of the optimized implant site.

In a second solution, calculating optimized real parameters PSIR comprises a step f72 of comparing the first deviations ΔUI and the median MD of the second deviations ΔBMij.

As shown in FIG. 2, a second calculation module 304B in the processing unit 304 is configured to perform step f72.

As is known, the median is the value that occupies the central position in an ordered set of data.

The median is a measure which is little affected by the presence of abnormal data and due to this it is used when one wishes to mitigate the effect of extreme values.

The step f72 of comparing the first deviations ΔUI and the median (MD) of the second deviations ΔBMij comprises the steps of:

-   -   calculating if the median MD of the second deviations ΔBMij is         smaller than the first deviations ΔUI;     -   comparing the value of the median MD calculated together with         the values of the first deviations ΔUI;     -   calculating the optimized real parameters PSIR as a function of         the comparison.

In more detail, following the comparison step, where the value of the calculated median MD is smaller than the first deviations ΔUI, i.e. if the median module MD is smaller than the second deviations ΔBMij, the step f72 provides an additional sub-step of calculating the optimized real parameters PSIR by modifying the parameters of the optimized implant site PSI with the value of the median MD being added or subtracted.

In other words, PSIR=PSI+|MD|

In a third solution, calculating real optimized parameters (PSIR) comprises a step f73 of comparing the first deviations ΔUI and the mode MO of the second deviations ΔBMij.

As shown in FIG. 2, a third calculation module 304C, within the processing unit 304, is configured to execute step f73.

As is known, the mode is the most recurring value in a data set.

The step f73 of comparing the first deviations ΔUI and the mode MO of the second deviations ΔBMij, comprises the steps of:

-   -   calculating if the mode MO of the second deviations ΔBMij is         smaller than the first deviations ΔUI;     -   comparing the value of the mode MO calculated with the values of         the first deviations ΔUI;     -   calculating the optimized real parameters PSIR according to the         comparison.

More in detail, following the comparison sub-step, if the calculated value of the mode MO is lower than the first deviations ΔUI, i.e. if the modulus of the median MO is smaller than the second deviations ΔBMij, the step f72 provides a further sub-step of calculating the optimized real parameters PSIR by modifying the parameters of the optimized implant site PSI by summing or subtracting the mode MO value.

The PSIR values obtained in one or more of the described modalities guarantee the technical effect of an objective identification in respect to an actual optimal dental implant thereby making it possible to adapt the guidelines on which dental implant construction is based, to optimal real and objective values.

According to the invention, the described monitoring method is adapted to be computer-implemented.

The invention further provides a computer program which, when in use on a processing means, performs one or more of the steps of the computer-implemented method.

According to the invention, the optimal real dental implant ID, described above, is adapted to be realized as a function of the optimized real parameters PSIR according to one of the solutions shown.

In general it should be noted that in the present context and in the subsequent claims, the first processing station 40, the second processing station 30 and the processing unit 304 are described as divided into separate functional modules (memory modules or operating modules) at the only purpose of describing the functions in a clear and complete manner.

Indeed, such processing stations/units may consist of a single electronic device, suitably programmed to perform the described functions, and the different modules may correspond to hardware entities and/or software routines being part of the programmed device.

Alternatively or additionally, such functionalities may be performed by a plurality of electronic devices whereon said functional modules can be distributed.

The processing stations/units may also use one or more processors to execute the instructions contained in the memory modules.

The aforementioned functional modules may also be distributed on different computers locally or remotely depending on the architecture of the network they reside in.

The systems further comprise all memory and/or operating modules and/or means required to implement the functions as described in the methods thereof. 

1. Monitoring method of dental implants comprising the steps of: (f1) graphically simulating, via a computer-implemented graphic simulation, an anatomy of an envisaged dental prosthesis (PD) coupleable to a dental implant (ID) which is inserteartable into a maxillary bone (OM); (f2) simulating, based on a computer-implemented graphic mode, an optimized implant site (SI) for said dental implant (ID) as a function of implant parameters (PIMP) of said dental implant (ID) and of first parameters (PSI) of said optimized implant site (SI); (f4) calculating a plurality of optimal dental implants (BMIi) as a function of comparing between at least the first parameters (PSI) and representative parameters (PIE) of existing dental implants as a function of a minimized rating (R) of said optimized implant site (SI), wherein the rating (R) is indicative of the optimized implant site (SI) being in compliance with predefined reference thresholds of the first representative parameters (PSI); (f5) selecting a usable implant (UI) from said plurality of optimal dental implants (BMIi); (f6) calculating first deviations (ΔUI) between said first parameters (PSI) of said optimized implant site (SI) and first parameters (PUI) of said usable implant (IU); (f7) calculating second deviations (ΔBMij) between second parameters (PBMij) of at least one plurality (P1, P2) of optimal dental implants (BMij) of said plurality of optimal dental implants (BMIi) not selected as usable implants (UI) and said first parameters (PSI) of said optimized implant site (SI); (f8) calculating real optimized parameters (PSIR) of said optimized implant site (SI) as a combined function of said first deviations (ΔUI) and said second deviations (ΔBMij).
 2. Monitoring method according to claim 1 comprising a step (f9) of overlapping: said optimized implant site (SI), defined in said step (f8) of calculating real optimized parameters (PSIR) of said optimized implant site (SI) as a combined function of said first deviations (ΔUI) and said second deviations (ΔBMij), with said optimized implant site (SI), simulated in said step (f2) of simulating, based on a computer-implemented graphic mode, an optimized implant site (SI) for said dental implant (ID) as a function of implant parameters (PIMP) of said dental implant (ID) and first parameters (PSI) of said optimized implant site (SI), thus obtaining an overlapping between the original simulation and the actual post-production reconstruction of the dental implant.
 3. Monitoring method according to claim 1 or 2 wherein said step (f6) of calculating real optimized parameters (PSIR) comprises comparing one or more of: first deviations (ΔUI) and the average (M) of said second deviations (ΔBMij); first deviations (ΔUI) and the median (MD) of said second deviations (ΔBMij); first deviations (ΔUI) and the mode (MO) of said second deviations (ΔBMij).
 4. Monitoring method according to claim 3, wherein said step of comparing said first deviations (ΔUI) and said average (M) of said second deviations (ΔBMij), comprises the steps of: calculating said average (M) of the second deviations (ΔBMij); comparing the value of the average (M) found with the values of the first deviations (ΔUI); calculating the real optimized parameters (PSIR) as a function of this comparison.
 5. Monitoring method according to claim 4, wherein said step of comparing said first deviations (ΔUI) and said average (M) of said second deviations (ΔBMij), further comprises the step of: if the value of the calculated average (M) is lower than the first deviations (ΔUI), calculating the real optimized parameters (PSIR) by modifying the parameters (PSI) of the optimized implant site (SI) with the average value (M) being summed or substracted.
 6. Monitoring method according to claim 3, wherein said step of comparing said first deviations (ΔUI) and said median (MD) of said second deviations (ΔBMij) comprises the steps of: calculating if said median (MD) of said second deviations (ΔBMij) is lower than said first deviations (ΔUI); comparing the value of the median (MD) calculated with the values of the first deviations (ΔUI); calculating said real optimized parameters (PSIR) as a function of this comparison.
 7. Monitoring method according to claim 6 wherein said step of comparing said first deviations (ΔUI) and said median (MD) of said second deviations (ΔBMij) further comprises the steps of: after the comparison step, if the value of the calculated median MD is smaller than the first deviations ΔUI, calculating the real optimized parameters (PSIR) by modifying the parameters (PSI) of the optimized implant site (SI) with the median value (MD) being summed or subtracted.
 8. Monitoring method according to claim 3 wherein said step of comparing said first deviations (ΔUI) and said mode (MO) of said second deviations (ΔBMij) comprises the steps of: calculating if said mode (MO) of said second deviations (ΔBMij) is lower than said first deviations (ΔUI); comparing the mode (MO) value calculated with the values of the first deviations (ΔUI); calculating said real optimized parameters (PSIR) as a function of said comparison.
 9. Monitoring method according to claim 8, wherein said step of comparing said first deviations (ΔUI) and said mode (MO) of said second deviations (ΔBMij), further comprises the steps of: after the comparison step, if the calculated mode (MO) value is smaller than the first deviations (ΔUI), calculating the real optimized parameters (PSIR) by modifying the parameters (PSI) of the optimized implant site (SI) with the mode MO value being summed or substracted.
 10. Method according to claim 1 or 2 wherein said step (f7) of calculating second deviations (ΔBMij) comprises: calculating second positive deviations (ΔBMij+ ) and/or second negative deviations (ΔBMij defined respectively as a function of an optimal implant diameter value (BMIi) being higher or lower than the diameter value of the optimized implant site PSI; calculating optimized real oversized parameters PSIR+ and/or optimized real undersized parameters PSIR− of the optimized implant site SI as a combined function of the first deviations ΔUI and respectively of the second positive (ΔBMij+ ) or negative (ΔBMij−) deviations.
 11. Monitoring method according to any one of the preceding claims, wherein said implant parameters (PIMP) comprise at least: said identified tooth (Tn); a first cervical distance (CTi) and a first apical distance (ETi) of the maxillary bone (OM) at an edentulous site (LR), corresponding to the envisaged dental prosthesis (PD), wherein the distances are calculated in a first direction relative to the maxillary bone (OM); a second cervical distance (CWi) and a second apical distance (EWi) of the maxillary bone OM at said edentulous site (LR), wherein the distances are calculated in a second direction relative to the maxillary bone (OM); a first bone height (HRi) representative of a bone availability of the maxillary bone (OM) at the edentulous site (LR); a variable deviation angle (αi) between an ideal surgical axis (CI) of the maxillary bone (OM) and an ideal prosthetic axis (PI) passing through the dental prosthesis (PD).
 12. Monitoring method according to claim 11 wherein said first parameters (PSI) of said optimized implant site (SI) comprise at least: a diameter (DTi) of an at least partially cylindrical volumetric shape (VSI) of said optimized implant site (SI); a height (LIi) of said at least partially cylindrical volumetric shape (VSI) of said optimized implant site (SI); said one variable deviation angle (αi); wherein said first representative parameters (PSI) have variable values as a function of said variable deviation angle (αi) and said overall rating value (R).
 13. Monitoring method according to any of the preceding claims wherein at least one first plurality (P1) of optimal dental implants (BMij) comprises a first plurality (n) of implants with rating (RBMij) proximate to a rating (RPSI) of the optimized implant site. (PSI).
 14. Monitoring method according to any of the preceding claims wherein at least one second plurality (P2) of optimal dental implants (BMij) comprises a second plurality (m) of implants with rating (RBMij) lower than a predefined rating value (R_pred).
 15. Computer program which, in use, on a processing means, performs one or more of the steps of any one of claims 1 to
 14. 16. Monitoring system of dental implants comprising: a first simulation station (1) designed to graphically simulate, via computer-implemented graphic simulation, an anatomy of a provided dental prosthesis (PD) coupleable to a dental implant (ID) and inserteable into a maxillary bone (OM); a second simulation station (10) designed to simulate, via computer-implemented graphic simulation, an optimized implant site (SI) for said dental implant (ID) as a function of implant parameters (PIMP) of said dental implant (ID) and first parameters (PSI) of said optimized implant site (SI); a first processing station (20) capable of calculating parameters of a plurality of optimal dental implants (BMIi) as a function of comparing between the at least first parameters (PSI) of said optimized implant site (SI) and representative parameters (PIE) of existing dental implants as a function of a minimized rating (R) of said optimized implant site (SI), wherein the rating (R) is indicative of the optimized implant site (SI) being in compliance with predefined reference thresholds of the first representative parameters (PSI); a second processing station (30) suitable for calculating real optimized parameters (PSIR) of said optimized implant site (SI), comprising: a first calculation unit (301) suitable for selecting a usable implant (UI) from said plurality of optimal dental implants (BMIi); a second calculation unit (302) able to calculate first deviations (ΔUI) between said parameters of said optimized implant site (PSI) and first parameters (PUI) of said usable implant (UI); a third processing unit (303) able to calculate second deviations (ΔBMij) between second parameters (PBMij) of at least one plurality (P1, P2) of optimal dental implants (BMij) of said plurality of optimal dental implants (BMIi) not selected as usable implants (UI) and said parameters of said optimized implant site (PSI); a fourth processing unit (304) able to calculate real optimized parameters (PSIR) of said optimized implant site (SI) as a combined function of said first deviations (ΔUI) and said second deviations (ΔBMij).
 17. Monitoring system according to claim 16 wherein said second processing station (30) comprises in turn, an overlapping module (305) configured to perform step (f9) of overlapping: said real optimized parameters (PSIR) of said optimized implant site (SI) calculated from said fourth calculation unit (304) as a combined function of said first deviations (ΔUI) and said second deviations (ΔBMij), with said optimized implant site (SI), simulated based on a computer-implemented graphic mode, for said dental implant (ID) as a function of said implant parameters (PIMP) of said dental implant (ID) and of first parameters (PSI) of said optimized implant site (SI), thereby obtaining an overlapping between the original simulation and the actual post-production reconstruction of the dental implant.
 18. Monitoring system according to claim 16 or 17 wherein said fourth calculation unit (304) comprises one or more of: a first comparison module (304A) configured to compare said first deviations (ΔUI) and the average of said second deviations (ΔBMij); a second comparison module (304B) configured to compare said first deviations (ΔUI) and the median of said second deviations (ΔBMij); a third comparison module (304C) configured to compare first deviations (ΔUI) and the mode of said second deviations (ΔBMij).
 19. Monitoring system according to claim 18 wherein said first comparison module (304A) is configured for: calculating said average (M) of the second deviations (ΔBMij); comparing the value of the average (M) derived from the values of the first deviations (ΔUI); calculating the real optimized parameters (PSIR) according to this comparison.
 20. Monitoring system according to claim 19, wherein said first comparison module (304A) is further configured for: calculating the real optimized parameters (PSIR) by modifying the parameters (PSI) of the optimized implant site (SI) by summing or subtracting the value of the average (M), if the condition applies based on which the value of the calculated average (M) is lower than the first deviations (ΔUI).
 21. Monitoring system according to any one of claims 18 to 20, wherein said second comparison module (304B) is configured for; calculating if said median (MD) of said second deviations (ΔBMij) is lower than said first deviations (ΔUI); comparing the value of the median (MD) calculated with the values of the first deviations (ΔUI); calculating said real optimized parameters (PSIR) as a function of said comparison.
 22. Monitoring system according to claim 21 wherein said second comparison module (304B) is further configured for; after the comparison sub-step, calculating the real optimized parameters (PSIR) by modifying the parameters (PSI) of the optimized implant site (SI) with the median (MD) value being summed or subtracted, if the condition applies based on which the median (MD) value calculated is less than the first deviations (ΔUI).
 23. Monitoring system according to any one of claims 18 to 22 wherein said third comparison module (304C) is configured for calculating if said average (MO) of said second deviations (ΔBMij) is lower than said first deviations (ΔUI); comparing the mode (MO) value calculated with the values of the first deviations (ΔUI); calculating said real optimized parameters (PSIR) as a function of said comparison.
 24. Monitoring system according to claim 23 wherein said third comparison module (304C) is further configured for after the comparison sub-step, calculating the real optimized parameters (PSIR) by modifying the parameters (PSI) of the optimized implant site (SI) with the mode MO value being summed or subtracted, if the condition applies based on which the value of the mode (MO) calculated is less than the first deviations (ΔUI).
 25. Monitoring system according to any one of claims 16 to 24 wherein said third calculation unit (303) is configured for calculating second positive deviations (ΔBMij+) and/or second negative deviations (ΔBMij defined respectively as a function of an optimal implant diameter value (BMIi) higher or lower than the diameter value of the optimized implant site PSI; calculating oversized real optimized parameters (PSIR+) and/or undersized real optimized parameters (PSIR−) of the optimized implant site (SI) as a combined function of the first deviations (ΔUI) and of the second positive (ΔBMij+ ) or negative (ΔBMij−) deviations respectively.
 26. Monitoring system according to any one of claims 16 to 25, wherein said implant parameters (PIMP) comprise at least: said identified tooth (Tn); a first cervical distance (CTi) and a first apical distance (ETi) of the maxillary bone (OM) at an edentulous site (LR), corresponding to the envisaged dental prosthesis (PD), wherein the distances are calculated in a first direction relative to the maxillary bone (OM); a second cervical distance (CWi) and a second apical distance (EWi) of the maxillary bone OM at said edentulous site (LR), wherein the distances are calculated in a second direction relative to the maxillary bone (OM); a first bone height (HRi) representative of a bone availability of the maxillary bone (OM) at the edentulous site (LR); a variable deviation angle (αi) between an ideal surgical axis (CI) of the maxillary bone (OM) and an ideal prosthetic axis (PI) passing through the dental prosthesis (PD).
 27. Monitoring system according to any one of claims 16 to 26, wherein said first parameters (PSI) of said optimized implant site (SI) comprise at least: a diameter (DTi) of an at least partially cylindrical volumetric shape (VSI) of said optimized implant site (SI); a height (LIi) of said at least partially cylindrical volumetric shape (VSI) of said optimized implant site (SI); said one variable deviation angle (αi); wherein said first representative parameters (PSI) have variable values as a function of said variable deviation angle (αi) and of said overall rating value (R).
 28. Monitoring system according to any one of claims 16 to 27 wherein at least one first plurality (P1) of optimal dental implants (BMij) comprises a first plurality (n) of implants with rating (RBMij) being proximate to a rating (RPSI) of the optimized implant site (PSI).
 29. Monitoring system according to any one of claims 16 to 28 wherein at least one second plurality (P2) of optimal dental implants (BMij) comprises a second plurality (m) of implants with rating (RBMij) lower than a predefined rating value (R_pred).
 30. Dental implant (ID) suitable to be realized as a function of said real optimized parameters (PSIR) according to any one of the preceding claims. 